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Edao, Yuki; Sato, Katsumi; Iwai, Yasunori; Hayashi, Takumi
Journal of Nuclear Science and Technology, 53(11), p.1831 - 1838, 2016/11
Times Cited Count:8 Percentile:60.26(Nuclear Science & Technology)Nakano, Tomohide; Tsuzuki, Kazuhiro; Higashijima, Satoru; Kubo, Hirotaka; Asakura, Nobuyuki
Europhysics Conference Abstracts (CD-ROM), 29C, 4 Pages, 2005/00
Emission rates of CH and C spectral bands for CH, CD_2 loss events due to dissociation, ionization and transport were measured in JT-60U divertor plasmas. The obtained data were used for estimating the chemical sputtering yields by a spectroscopic technique. The CH loss events over one CH photon emission was about 200 at electron temperatures between 30 eV and 70 eV. These values fell within the confidential band of the CD one. The CH loss events over one CH and one C photon emission were, respectively, between 200 - 300 and between 600 - 1800, and their ratio between 3 - 6. On the assumption that only CH among hydrocarbons generated by chemical sputtering emits the C spectral bands, the intensity of the CH spectral bands originating from CH is inferred from the intensity of C spectral bands multiplied by the obtained ratio, resulting in higher than the measured CH intensity. This result indicates that dominant hydrocarbons generated by the chemical sputtering is not CH but CH.
Kubo, Hirotaka; Takenaga, Hidenobu; Nakano, Tomohide; Higashijima, Satoru; Shimizu, Katsuhiro; Sawada, Keiji*; Kobayashi, Shinji*; JT-60 Team
Nuclear Fusion Research; Springer Series in Chemical Physics, Vol.78, p.121 - 134, 2004/11
no abstracts in English
Nakano, Tomohide; Kado, Shinichiro*
Purazuma, Kaku Yugo Gakkai-Shi, 80(2), p.91 - 100, 2004/02
Descriptions on the band structure of the system of a CH radical, the method of hydrocarbon flux measurement and the modeling of hydrocarbon elementary processes are given. Then, the reviews of recent research achievements are presented. At JT-60U divertor plates, the chemical sputtering yields of not only but also have been measured with simultaneous measurement of CH and bands. In MAP-II of the University of Tokyo, hydrocarbon-enhanced molecular assisted recombination processes have been qualitatively proved by comparison of the measured and the modeled CH band intensity.
Kusakabe, Toshio*; Miyamoto, Yoshiharu*; Ishida, Rikiya*; Ito, Kojiro*; Kuroyanagi, Nobuhiro*; Nakai, Yota*; Shirai, Toshizo
Nuclear Instruments and Methods in Physics Research B, 205, p.600 - 604, 2003/05
Times Cited Count:6 Percentile:43.07(Instruments & Instrumentation)no abstracts in English
Kubo, Hirotaka
AIP Conference Proceedings 636, p.161 - 170, 2002/00
no abstracts in English
Higashijima, Satoru; Kubo, Hirotaka; Sugie, Tatsuo; Shimizu, Katsuhiro; Sakasai, Akira; Asakura, Nobuyuki; Sakurai, Shinji; Hosogane, Nobuyuki; Konoshima, Shigeru; Tamai, Hiroshi; et al.
Journal of Nuclear Materials, 266-269, p.1078 - 1083, 1999/00
Times Cited Count:7 Percentile:49.7(Materials Science, Multidisciplinary)no abstracts in English
Ito, Akio*; Imanishi, Nobutsugu*; *; Hamamoto, Nariaki*; *; Tanaka, Takashi*; *; Saito, Manabu*; Haruyama, Yoichi*; Shirai, Toshizo
Journal of the Physical Society of Japan, 64(9), p.3255 - 3264, 1995/09
Times Cited Count:20 Percentile:70.71(Physics, Multidisciplinary)no abstracts in English
Journal of Applied Physics, 67(9), p.4118 - 4125, 1990/05
Times Cited Count:3 Percentile:24.18(Physics, Applied)no abstracts in English
Journal of Nuclear Materials, 174, p.118 - 120, 1990/00
Times Cited Count:8 Percentile:81.56(Materials Science, Multidisciplinary)no abstracts in English
;
Radiation Physics and Chemistry, 33(6), p.567 - 572, 1989/00
no abstracts in English
*
J.Vac.Sci.Technol.,A, 5(3), p.305 - 307, 1987/03
no abstracts in English
;
JAERI-M 83-126, 113 Pages, 1983/08
no abstracts in English
Int.J.Appl.Radiat.Isot., 34(3), p.559 - 564, 1983/00
no abstracts in English
; ;
J.Chem.Soc.,Faraday Trans.,I, 79, p.1973 - 1986, 1983/00
no abstracts in English
; Hotta, Hiroshi
Radiat.Res., 64(3), p.407 - 415, 1975/03
Times Cited Count:3no abstracts in English
Tachikawa, Enzo; F.S.Rowland*
J.Am.Chem.Soc., 90, p.4767 - 4773, 1968/00
Times Cited Count:63no abstracts in English